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ATS
1998
IEEE
106views Hardware» more  ATS 1998»
15 years 10 months ago
A Test Pattern Generation Algorithm Exploiting Behavioral Information
This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto
VTS
1996
IEEE
74views Hardware» more  VTS 1996»
15 years 10 months ago
An unexpected factor in testing for CMOS opens: the die surface
In this paper, we for the rst time present experimental evidence that the die surface can act as an RC interconnect, becoming an important factor in determining the voltage of a o...
Haluk Konuk, F. Joel Ferguson
AIIDE
2007
15 years 8 months ago
Level Annotation and Test by Autonomous Exploration: Abbreviated Version
This paper proposes the use of an autonomous exploring agent to generate and annotate the waypoint graph as an offline process during level development. The explorer incrementally...
Christian Darken
ITC
2003
IEEE
158views Hardware» more  ITC 2003»
15 years 11 months ago
Extraction Error Diagnosis and Correction in High-Performance Designs
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikara...
MIDDLEWARE
2009
Springer
15 years 11 months ago
Automatic Stress Testing of Multi-tier Systems by Dynamic Bottleneck Switch Generation
Abstract. The performance of multi-tier systems is known to be significantly degraded by workloads that place bursty service demands on system resources. Burstiness can cause queu...
Giuliano Casale, Amir Kalbasi, Diwakar Krishnamurt...