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KBSE
2007
IEEE
16 years 21 days ago
Testing concurrent programs using value schedules
Concurrent programs are difficult to debug and verify because of the nondeterministic nature of concurrent executions. A particular concurrency-related bug may only show up under ...
Jun Chen, Steve MacDonald
TJS
2002
136views more  TJS 2002»
15 years 6 months ago
A Virtual Test Facility for the Simulation of Dynamic Response in Materials
The Center for Simulating Dynamic Response of Materials at the California Institute of Technology is constructing a virtual shock physics facility for studying the response of vari...
Julian Cummings, Michael Aivazis, Ravi Samtaney, R...
VLSID
2009
IEEE
150views VLSI» more  VLSID 2009»
16 years 7 months ago
TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis...
DIS
1998
Springer
15 years 10 months ago
Learning with Globally Predictive Tests
We introduce a new bias for rule learning systems. The bias only allows a rule learner to create a rule that predicts class membership if each test of the rule in isolation is pred...
Michael J. Pazzani
ICCV
2007
IEEE
16 years 8 months ago
An Empirical Study of Object Category Recognition: Sequential Testing with Generalized Samples
In this paper we present an empirical study of object category recognition using generalized samples and a set of sequential tests. We study 33 categories, each consisting of a sm...
Liang Lin, Shaowu Peng, Jake Porway, Song Chun Zhu...