6704 search results - page 130 / 1341 » Testing Scenario-Based Models |
148
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DATE
2006
IEEE
16 years 14 days ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
153
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EMSOFT
2006
Springer
15 years 10 months ago
2006
Springer
A key problem for effective unit testing is the difficulty of partitioning large software systems into appropriate units that can be tested in isolation. We present an approach th...
183
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TSE
2010
15 years 4 months ago
2010
We present an algorithm Dash to check if a program P satisfies a safety property ϕ. The unique feature of the algorithm is that it uses only test generation operations, and nes ...
145
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FATES
2003
Springer
15 years 11 months ago
2003
Springer
Abstract. We adapt and extend the theories used in the general framework of automated software testing in such a way that they become suitable for black-box conformance testing of ...
154
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IWANN
1995
Springer
15 years 10 months ago
1995
Springer
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...