6704 search results - page 128 / 1341 » Testing Scenario-Based Models |
148
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ATS
2005
IEEE
16 years 1 days ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
148
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DATE
1998
IEEE
15 years 10 months ago
1998
IEEE
Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....
158
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ISSTA
2006
ACM
16 years 11 days ago
2006
ACM
In black-box testing, one is interested in creating a suite of tests from requirements that adequately exercise the behavior of a software system without regard to the internal st...
199
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ISQED
2002
IEEE
15 years 11 months ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
169
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SSIRI
2010
15 years 4 months ago
2010
— Model-based approaches, especially based on directed graphs (DG), are becoming popular for mutation testing as they enable definition of simple, nevertheless powerful, mutation...