6704 search results - page 116 / 1341 » Testing Scenario-Based Models |
152
click to vote
DATE
2000
IEEE
15 years 10 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
195
click to vote
DSRT
2008
IEEE
15 years 8 months ago
2008
IEEE
The complexity and the variety of the deployed timedependent systems, as well as the high degree of reliability required for their global functioning, justify the care provided to...
158
click to vote
IOLTS
2006
IEEE
16 years 12 days ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
201
click to vote
FOCS
2002
IEEE
15 years 11 months ago
2002
IEEE
We consider the problem of testing 3-colorability in the bounded-degree model. We show that, for small enough ε, every tester for 3colorability must have query complexity Ω(n)....
177
click to vote
AIR
2005
15 years 6 months ago
2005
Term-weighting schemes are vital to the performance of Information Retrieval models that use term frequency characteristics to determine the relevance of a document. The vector spa...