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151
Voted
DATE
2008
IEEE
84views Hardware» more  DATE 2008»
16 years 8 days ago
Physically-Aware N-Detect Test Pattern Selection
N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of Ndetect test do not necessarily exploit the localized characte...
Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D...
181
Voted
SEUS
2007
IEEE
16 years 2 days ago
A Framework for Hardware-in-the-Loop Testing of an Integrated Architecture
In this paper we present a distributed Hardware-in-the-Loop (HiL) simulation approach that supports the verification and validation activities in an integrated architecture as rec...
Martin Schlager, Roman Obermaisser, Wilfried Elmen...
145
Voted
IUI
2000
ACM
15 years 10 months ago
Requirements elicitation for an intelligent software test environment for the physically challenged
This paper is about the elicitation of the requirements for an intelligent interface for a software test development environment that will accommodate the physically challenged (P...
Warren Moseley
165
Voted
DDECS
2009
IEEE
149views Hardware» more  DDECS 2009»
15 years 9 months ago
Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated wi...
Yiorgos Sfikas, Yiorgos Tsiatouhas
CSO
2009
IEEE
16 years 17 days ago
Association Rules Based Data Mining on Test Data of Physical Health Standard
With the development of modern electronic and computer technologies, sports training and competition became more and more technical. A great deal of data were recorded, including ...
Lan Yu