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ITC
2003
IEEE
170views Hardware» more  ITC 2003»
16 years 9 days ago
Double-Tree Scan: A Novel Low-Power Scan-Path Architecture
In a scan-based system with a large number of flip-flops, a major component of power is consumed during scanshift and clocking operation in test mode. In this paper, a novel scan-...
Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zha...
DAWAK
2006
Springer
15 years 10 months ago
Mixed Decision Trees: An Evolutionary Approach
In the paper, a new evolutionary algorithm (EA) for mixed tree learning is proposed. In non-terminal nodes of a mixed decision tree different types of tests can be placed, ranging ...
Marek Kretowski, Marek Grzes
KBSE
2000
IEEE
15 years 10 months ago
Mutation Operators for Specifications
Testing has a vital support role in the software engineering process, but developing tests often takes significant resources. A formal specification is a repository of knowledge a...
Paul E. Black, Vadim Okun, Yaacov Yesha
ICASSP
2010
IEEE
15 years 7 months ago
A kernel mean matching approach for environment mismatch compensation in speech recognition
The mismatch between training and test environmental conditions presents a challenge to speech recognition systems. In this paper, we investigate an approach for matching the dist...
Abhishek Kumar, John H. L. Hansen
CCS
2007
ACM
16 years 1 months ago
Defining categories to select representative attack test-cases
To ameliorate the quality of protection provided by intrusion detection systems (IDS) we strongly need more effective evaluation and testing procedures. Evaluating an IDS against ...
Mohammed S. Gadelrab, Anas Abou El Kalam, Yves Des...