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EURODAC
1994
IEEE
130views VHDL» more  EURODAC 1994»
15 years 11 months ago
RESIST: a recursive test pattern generation algorithm for path delay faults
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
Karl Fuchs, Michael Pabst, Torsten Rössel
HIS
2004
15 years 8 months ago
GAP Test: A Cognitive Evaluation Procedure for Shape Descriptors
With inspiration from psychophysical researches of the human visual system we propose a novel method for performance evaluation of contour based shape recognition algorithms. We u...
Anarta Ghosh, Nicolai Petkov
CORR
2010
Springer
210views Education» more  CORR 2010»
15 years 6 months ago
Test Case Generation for Object-Oriented Imperative Languages in CLP
Testing is a vital part of the software development process. Test Case Generation (TCG) is the process of automatically generating a collection of test-cases which are applied to ...
Miguel Gómez-Zamalloa, Elvira Albert, Germ&...
SIGSOFT
2010
ACM
15 years 4 months ago
Community-based, collaborative testing and analysis
This article proposes a research agenda aimed at enabling optimized testing and analysis processes and tools to support component-based software development communities. We hypoth...
Atif M. Memon, Adam A. Porter, Alan Sussman
SOCO
2009
Springer
16 years 1 months ago
A Framework for Testing Model Composition Engines
Model composition helps designers managing complexities by modeling different system views separately, and later compose them into an integrated model. In the past years, researche...
Freddy Munoz, Benoit Baudry