This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
With inspiration from psychophysical researches of the human visual system we propose a novel method for performance evaluation of contour based shape recognition algorithms. We u...
Testing is a vital part of the software development process. Test Case Generation (TCG) is the process of automatically generating a collection of test-cases which are applied to ...
This article proposes a research agenda aimed at enabling optimized testing and analysis processes and tools to support component-based software development communities. We hypoth...
Model composition helps designers managing complexities by modeling different system views separately, and later compose them into an integrated model. In the past years, researche...