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UML
2004
Springer
16 years 2 days ago
The AGEDIS Tools for Model Based Testing
We describe the tools and interfaces created by the AGEDIS project, a European Commission sponsored project for the creation of a methodology and tools for automated model driven ...
Alan Hartman, Kenneth Nagin
ICCAD
1997
IEEE
144views Hardware» more  ICCAD 1997»
15 years 11 months ago
Partial scan delay fault testing of asynchronous circuits
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...
130
Voted
COMPUTING
2007
101views more  COMPUTING 2007»
15 years 6 months ago
Comparison of the Hansen-Sengupta and the Frommer-Lang-Schnurr existence tests
The Krawczyk and the Hansen-Sengupta interval operators are closely related to the interval Newton operator. These interval operators can be used as existence tests to prove exist...
Alexandre Goldsztejn
164
Voted
ISSTA
2006
ACM
16 years 21 days ago
Coverage metrics for requirements-based testing
In black-box testing, one is interested in creating a suite of tests from requirements that adequately exercise the behavior of a software system without regard to the internal st...
Michael W. Whalen, Ajitha Rajan, Mats Per Erik Hei...
VTS
2005
IEEE
95views Hardware» more  VTS 2005»
16 years 9 days ago
SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
Baosheng Wang, Yuejian Wu, Josh Yang, André...