11172 search results - page 306 / 2235 » Testing Physical Systems |
163
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ISCAS
2005
IEEE
16 years 8 days ago
2005
IEEE
This work presents a cost-effective test structure that is applicable to built-in self-test of time-to-digital converters (TDCs). The proposed structure uses deterministic dynamic ...
190
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VTS
2002
IEEE
15 years 11 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
150
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ITC
1999
IEEE
15 years 11 months ago
1999
IEEE
The embedded core testing methodology at Advanced Micro Devices Inc. involves adopting a disciplined system for developing new products with a focus on time to market and engineer...
182
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PTS
2004
15 years 8 months ago
2004
In this paper, we propose two fault models and methods for the derivation of interoperability test suites when the system implementation is given in the form of two deterministic c...
160
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SNPD
2003
15 years 8 months ago
2003
We present our experience in automatically deriving a detailed test case plan exclusively using the UML diagrams developed during the analysis and design phases. We consider in pa...