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ITC
2003
IEEE
145views Hardware» more  ITC 2003»
15 years 12 months ago
MEMS Manufacturing Testing: An Accelerometer Case Study
Electrical testing of MicroElectroMechanical Systems (MEMS) can take on many different forms including wafer probing, electrical trimming, final test at temperatures, engineering ...
Theresa Maudie, Alex Hardt, Rick Nielsen, Dennis S...
EVOW
1999
Springer
15 years 11 months ago
Test Pattern Generation Under Low Power Constraints
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Re...
FORTEST
2008
15 years 8 months ago
From MC/DC to RC/DC: Formalization and Analysis of Control-Flow Testing Criteria
This paper describes an approach to the formalization of existing criteria used in computer systems software testing and proposes a new Reinforced Condition/Decision Coverage (RC/D...
Sergiy A. Vilkomir, Jonathan P. Bowen
ICWS
2010
IEEE
15 years 5 months ago
Timed Extended Invariants for the Passive Testing of Web Services
The service-oriented approach is becoming more and more popular to integrate highly heterogeneous systems. Web services are the natural evolution of conventional middleware techno...
Gerardo Morales, Stéphane Maag, Ana R. Cava...
UTP
2010
15 years 4 months ago
Specification Coverage for Testing in Circus
Abstract. The Unifying Theories of Programming underpins the development of Circus, a state-rich process algebra for refinement. We have previously presented a theory of testing fo...
Ana Cavalcanti, Marie-Claude Gaudel