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ICCD
2008
IEEE
202views Hardware» more  ICCD 2008»
16 years 3 months ago
CrashTest: A fast high-fidelity FPGA-based resiliency analysis framework
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
Andrea Pellegrini, Kypros Constantinides, Dan Zhan...
DOLAP
2009
ACM
16 years 1 months ago
A comprehensive approach to data warehouse testing
Testing is an essential part of the design life-cycle of any software product. Nevertheless, while most phases of data warehouse design have received considerable attention in the...
Matteo Golfarelli, Stefano Rizzi
ISNN
2005
Springer
16 years 4 days ago
Non-parametric Statistical Tests for Informative Gene Selection
This paper presents two non-parametric statistical test methods, called Kolmogorov-Smirnov (KS) and U statistic test methods, respectively, for informative gene selection of a tumo...
Jinwen Ma, Fuhai Li, Jianfeng Liu
HICSS
2003
IEEE
179views Biometrics» more  HICSS 2003»
15 years 12 months ago
JUMBL: A Tool for Model-Based Statistical Testing
Statistical testing of software based on a usage model is a cost-effective and efficient means to make inferences about software quality. In order to apply this method, a usage m...
Stacy J. Prowell
GECCO
2003
Springer
108views Optimization» more  GECCO 2003»
15 years 12 months ago
Evolutionary Testing of Flag Conditions
Evolutionary Testing (ET) has been shown to be very successful in testing real world applications [16]. However, it has been pointed out [11], that further research is necessary if...
André Baresel, Harmen Sthamer