Sciweavers
Explore
Publications
Books
Software
Tutorials
Presentations
Lectures Notes
Datasets
Labs
Conferences
Community
Upcoming
Conferences
Top Ranked Papers
Most Viewed Conferences
Conferences by Acronym
Conferences by Subject
Conferences by Year
Tools
PDF Tools
Image Tools
Text Tools
OCR Tools
Symbol and Emoji Tools
On-screen Keyboard
Latex Math Equation to Image
Smart IPA Phonetic Keyboard
Community
Sciweavers
About
Terms of Use
Privacy Policy
Cookies
11172
search results - page 190 / 2235
»
Testing Physical Systems
Sort
relevance
views
votes
recent
update
View
thumb
title
160
click to vote
VLSID
1995
IEEE
112
views
VLSI
»
more
VLSID 1995
»
An efficient automatic test generation system for path delay faults in combinational circuits
15 years 10 months ago
Download
eprints.iisc.ernet.in
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
claim paper
Read More »
131
click to vote
MUC
1991
94
views
Natural Language Processing
»
more
MUC 1991
»
McDonnell Douglas Electronic Systems Company: MUC-3 test results and analysis
15 years 10 months ago
Download
www.aclweb.org
David de Hilster, Amnon Meyers
claim paper
Read More »
138
click to vote
MUC
1991
92
views
Natural Language Processing
»
more
MUC 1991
»
SRI International's TACITUS system: MUC-3 test results and analysis
15 years 10 months ago
Download
www.aclweb.org
Jerry R. Hobbs
claim paper
Read More »
127
click to vote
MUC
1991
64
views
Natural Language Processing
»
more
MUC 1991
»
New York University PROTEUS system: MUC-3 test results and analysis
15 years 10 months ago
Download
www.aclweb.org
Ralph Grishman, John Sterling, Catherine Macleod
claim paper
Read More »
112
click to vote
MUC
1991
107
views
Natural Language Processing
»
more
MUC 1991
»
ITP Interpretext system: MUC-3 test results and analysis
15 years 10 months ago
Download
www.aclweb.org
Kathleen Dahlgren, Carol Lord, Hajime Wada, Joyce ...
claim paper
Read More »
« Prev
« First
page 190 / 2235
Last »
Next »
