11172 search results - page 125 / 2235 » Testing Physical Systems |
181
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VLSID
2002
IEEE
16 years 6 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
163
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SBCCI
2004
ACM
15 years 11 months ago
2004
ACM
This paper proposes a test planning method capable of reusing available processors as test sources and sinks, and the on-chip network as the access mechanism for the test of cores...
192
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FMCO
2008
Springer
15 years 7 months ago
2008
Springer
Abstract. This paper presents a unified approach to test case generation and conformance test execution in a distributed setting. A model in the object-oriented, concurrent modelin...
108
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DATE
2007
IEEE
16 years 20 days ago
2007
IEEE
This paper discusses several forms of heterogeneity in systems on chip and systems in package. A means to distinguish the various forms of heterogeneity is given, with an estimati...
162
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CORR
2010
Springer
15 years 3 months ago
2010
Springer
Together with the concept of reversibility, another relevant physical notion is time-symmetry, which expresses that there is no way of distinguishing between backward and forward t...