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NIPS
2003
15 years 8 months ago
A Nonlinear Predictive State Representation
Predictive state representations (PSRs) use predictions of a set of tests to represent the state of controlled dynamical systems. One reason why this representation is exciting as...
Matthew R. Rudary, Satinder P. Singh
VTS
2003
IEEE
95views Hardware» more  VTS 2003»
15 years 12 months ago
Built-In Reseeding for Serial Bist
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
Ahmad A. Al-Yamani, Edward J. McCluskey
DATE
2000
IEEE
130views Hardware» more  DATE 2000»
15 years 11 months ago
Optimal Hardware Pattern Generation for Functional BIST
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, H...
ET
2010
122views more  ET 2010»
15 years 4 months ago
Fault Models for Quantum Mechanical Switching Networks
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
Jacob D. Biamonte, Jeff S. Allen, Marek A. Perkows...
ISSTA
1993
ACM
15 years 10 months ago
Mutation Analysis Using Mutant Schemata
Mutation analysis is a powerful technique for assessing and improving the quality of test data used to unit test software. Unfortunately, current automated mutation analysis syste...
Roland H. Untch, A. Jefferson Offutt, Mary Jean Ha...