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ISSRE
2003
IEEE
15 years 12 months ago
Reducing wasted development time via continuous testing
Testing is often performed frequently during development to ensure software reliability by catching regression errors quickly. However, stopping frequently to test also wastes tim...
David Saff, Michael D. Ernst
ICCAD
2000
IEEE
95views Hardware» more  ICCAD 2000»
15 years 11 months ago
Test of Future System-on-Chips
Spurred by technology leading to the availability of millions of gates per chip, system-level integration is evolving as a new paradigm, allowing entire systems to be built on a s...
Yervant Zorian, Sujit Dey, Mike Rodgers
IASTEDSE
2004
15 years 8 months ago
A symbolic Java virtual machine for test case generation
Quality management is becoming a more and more important part of the software development process. As software testing is currently understood as the core function of the quality ...
Roger A. Müller, Christoph Lembeck, Herbert K...
KBSE
2010
IEEE
15 years 5 months ago
MODA: automated test generation for database applications via mock objects
Software testing has been commonly used in assuring the quality of database applications. It is often prohibitively expensive to manually write quality tests for complex database ...
Kunal Taneja, Yi Zhang, Tao Xie
AICT
2008
IEEE
119views Communications» more  AICT 2008»
15 years 6 months ago
Simplification of Frequency Test for Random Number Generation Based on Chi-Square
This paper presents the simplified method of random test suite based on the frequency (block) test. The test is used to check the first property of random numbers which is to have ...
Kruawan Wongpanya, Keattisak Sripimanwat, Kanok Je...