2169 search results - page 213 / 434 » Testing Incremental Adaptation |
178
click to vote
GLVLSI
2005
IEEE
16 years 7 days ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
148
click to vote
DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
—The admission control problem is concerned with determining whether a new task may be accepted by a system consisting of a set of running tasks, such that the already admitted a...
190
click to vote
ET
2010
15 years 4 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
157
click to vote
HIPEAC
2009
Springer
16 years 1 months ago
2009
Springer
Process variations, which lead to timing and power variations across identically-designed components, have been identified as one of the key future design challenges by the semico...
203
click to vote
ICCS
2009
Springer
16 years 1 months ago
2009
Springer
Abstract. A framework for a fully implicit solution method is implemented into (1) the High Order Methods Modeling Environment (HOMME), which is a spectral element dynamical core o...