840 search results - page 80 / 168 » Test suite oscillations |
168
click to vote
GLVLSI
2008
IEEE
16 years 19 days ago
2008
IEEE
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
157
click to vote
ISORC
2008
IEEE
16 years 17 days ago
2008
IEEE
—An increasing number of real-time systems are embedded in mission critical systems such as target tracking systems, in which workloads may dynamically vary, for example, dependi...
149
click to vote
FPGA
2004
ACM
15 years 11 months ago
2004
ACM
This paper shows a method to verifying the thermal status of complex FPGA-based circuits like microprocessors. Thus, the designer can evaluate if a particular block is working bey...
142
click to vote
FPL
2004
Springer
15 years 11 months ago
2004
Springer
Abstract. The paper presents a high performance True Random Number Generator (TRNG) embedded in Altera Stratix Field Programmable Logic Devices (FPLDs). As a source of randomness, ...
156
click to vote
ISMVL
2000
IEEE
15 years 10 months ago
2000
IEEE
We have developed two novel methods of fabricating very small Si single-electron transistors (SETs), called PAtternDependent OXidation (PADOX) and Vertical PAttern-Dependent OXida...