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» Test pattern generation based on arithmetic operations
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SEW
2007
IEEE
16 years 4 days ago
Testing Patterns
: After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and...
Neelam Soundarajan, Jason O. Hallstrom, Adem Delib...
EURODAC
1995
IEEE
159views VHDL» more  EURODAC 1995»
15 years 9 months ago
The VHDL based design of the MIDA MPEG1 audio decoder
This paper describes the features and design methodology of MIDA, a MPEG1 integrated audio decoder. MIDA has been almost completely designed using automatic synthesis of VHDL desc...
Andrea Finotello, Maurizio Paolini
IOLTS
2007
IEEE
120views Hardware» more  IOLTS 2007»
16 years 5 days ago
Accelerating Soft Error Rate Testing Through Pattern Selection
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
JSW
2007
156views more  JSW 2007»
15 years 5 months ago
An Automatic Test Case Generation Framework for Web Services
— BPEL (Business Process Execution Language) as a de-facto standard for web service orchestration has drawn particularly attention from researchers and industries. BPEL is a semi...
Yongyan Zheng, Jiong Zhou, Paul Krause
IJON
2007
118views more  IJON 2007»
15 years 5 months ago
Low power CMOS electronic central pattern generator design for a biomimetic underwater robot
— This paper, presents a feasability study of a central pattern generator-based analog controller for an autonomous robot. The operation of a neuronal circuit formed of electroni...
Young-Jun Lee, Jihyun Lee, Kyung Ki Kim, Yong-Bin ...