502 search results - page 16 / 101 » Test pattern generation based on arithmetic operations |
219
click to vote
ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture A...
155
click to vote
VTS
1999
IEEE
15 years 10 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
181
click to vote
ICCAD
2003
IEEE
15 years 11 months ago
2003
IEEE
Domino circuits have been used in most modern high-performance microprocessor designs because of their high speed, low transistor-count and hazard-free operation. However, with te...
159
click to vote
FATES
2004
Springer
15 years 11 months ago
2004
Springer
We present an extension of Tretmans’ theory and algorithm for test generation for input-output transition systems to real-time systems. Our treatment is based on an operational i...
181
click to vote
TACAS
2007
Springer
15 years 12 months ago
2007
Springer
ion Randal E. Bryant1 , Daniel Kroening2 , Jo¨el Ouaknine3 , Sanjit A. Seshia4 , Ofer Strichman5 , and Bryan Brady4 1 Carnegie Mellon University, Pittsburgh 2 ETH Z¨urich 3 Oxfor...