502 search results - page 15 / 101 » Test pattern generation based on arithmetic operations |
160
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ICCAD
1997
IEEE
15 years 10 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
155
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GI
2001
Springer
15 years 10 months ago
2001
Springer
We present a pragmatic approach using formal methods to increase the quality of distributed component based systems: Based on UML class diagrams annotated with OCL constraints, co...
262
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PRL
2011
14 years 8 months ago
2011
Benchmarking pattern recognition, machine learning and data mining methods commonly relies on real-world data sets. However, there are some disadvantages in using real-world data....
181
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EVOW
2001
Springer
15 years 10 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
175
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FMICS
2008
Springer
15 years 7 months ago
2008
Springer
Lustre is a formal synchronous declarative language widely used for modeling and specifying safety-critical applications in the elds of avionics, transportation or energy productio...