5855 search results - page 405 / 1171 » Test generation and minimization with |
194
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ICCAD
2010
IEEE
15 years 4 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
165
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EOR
2008
15 years 6 months ago
2008
The car sequencing problem consists in sequencing a given set of cars to be produced in a single day. We address one of the variants of this problem, in which the objective of mini...
180
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ICIP
2009
IEEE
16 years 8 months ago
2009
IEEE
We present an algorithm able to register a known 3D deformable model to a set of 2D matched points extracted from a single image. Unlike previous approaches, the problem is solved...
171
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EMSOFT
2008
Springer
15 years 8 months ago
2008
Springer
C's volatile qualifier is intended to provide a reliable link between operations at the source-code level and operations at the memorysystem level. We tested thirteen product...
192
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NIPS
2007
15 years 8 months ago
2007
Empirical risk minimization offers well-known learning guarantees when training and test data come from the same domain. In the real world, though, we often wish to adapt a classi...