5855 search results - page 362 / 1171 » Test generation and minimization with |
149
click to vote
ICRA
2005
IEEE
16 years 12 days ago
2005
IEEE
Abstract - This paper presents a method for wheel-ground contact angle measurement and a traction control strategy minimizing slip in rough terrain. The slip minimization algorithm...
189
click to vote
CEC
2008
IEEE
15 years 8 months ago
2008
IEEE
— A technique for the visualization of stochastic population–based algorithms in multidimensional problems with known global minimizers is proposed. The technique employs proje...
182
click to vote
DAC
1994
ACM
15 years 11 months ago
1994
ACM
A powerful combinational path sensitization engine is required for the efficient implementation of tools for test pattern generation, timing analysis, and delay fault testing. Path...
154
click to vote
ICCAD
2007
IEEE
16 years 3 months ago
2007
IEEE
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
143
click to vote
ITC
2000
IEEE
15 years 11 months ago
2000
IEEE
We present the application of a deterministic logic BIST scheme on state-of-the-art industrial circuits. Experimental results show that complete fault coverage can be achieved for...