5855 search results - page 349 / 1171 » Test generation and minimization with |
232
click to vote
CSREAESA
2008
15 years 8 months ago
2008
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
159
click to vote
IJOE
2007
15 years 6 months ago
2007
: An environment targeted to e-learning is presented for teaching design and test of electronic systems. The environment consists of a set of Java applets, and of web based access ...
190
click to vote
ISOLA
2010
Springer
15 years 5 months ago
2010
Springer
Abstract. This article deals with performance verifications of architecture models of real-time embedded systems. We focus on models verified with the real-time scheduling theory...
176
click to vote
ICCAD
2010
IEEE
15 years 4 months ago
2010
IEEE
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
192
click to vote
ICCAD
2003
IEEE
16 years 2 days ago
2003
IEEE
The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...