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167
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ICST
2008
IEEE
16 years 1 months ago
2008
IEEE
Testing remains a major challenge for model transformation development. Test models that are used as test data for model transformations, are constrained by various sources of kno...
170
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
A high-level test synthesis (HLTS) method targeted for delay fault testability is presented. The proposed method, when combined with hierarchical test pattern generation for embed...
185
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ETS
2006
IEEE
16 years 25 days ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
143
Voted
DATE
2003
IEEE
16 years 2 days ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
181
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ICECCS
1997
IEEE
15 years 11 months ago
1997
IEEE
Software architectures can play a role in improving the testing process of complex systems. In particular, descriptions of the software architecture can be useful to drive integra...