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ISSTA
2012
ACM
13 years 9 months ago
Swarm testing
Swarm testing is a novel and inexpensive way to improve the diversity of test cases generated during random testing. Increased diversity leads to improved coverage and fault detec...
Alex Groce, Chaoqiang Zhang, Eric Eide, Yang Chen,...
KBSE
2010
IEEE
15 years 5 months ago
MiTV: multiple-implementation testing of user-input validators for web applications
User-input validators play an essential role in guarding a web application against application-level attacks. Hence, the security of the web application can be compromised by defe...
Kunal Taneja, Nuo Li, Madhuri R. Marri, Tao Xie, N...
ITC
1998
IEEE
114views Hardware» more  ITC 1998»
15 years 11 months ago
BETSY: synthesizing circuits for a specified BIST environment
This paper presents a logic synthesis tool called BETSY (BIST Environment Testable Synthesis) for synthesizing circuits that achieve complete (100%)fault coverage in a user specif...
Zhe Zhao, Bahram Pouya, Nur A. Touba
VTS
1995
IEEE
100views Hardware» more  VTS 1995»
15 years 10 months ago
Transformed pseudo-random patterns for BIST
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
Nur A. Touba, Edward J. McCluskey
GD
2006
Springer
15 years 10 months ago
Planarity Testing and Optimal Edge Insertion with Embedding Constraints
The planarization method has proven to be successful in graph drawing. The output, a combinatorial planar embedding of the so-called planarized graph, can be combined with state-o...
Carsten Gutwenger, Karsten Klein, Petra Mutzel