5855 search results - page 303 / 1171 » Test generation and minimization with |
153
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ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in s...
142
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MSE
2003
IEEE
15 years 12 months ago
2003
IEEE
A tool has been developed to automate the testing and grading of design projects implemented in reprogrammable hardware. The server allows multiple students to test circuits in FP...
128
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ITC
2000
IEEE
15 years 11 months ago
2000
IEEE
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...
137
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DAC
1996
ACM
15 years 11 months ago
1996
ACM
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
176
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PTS
1998
15 years 8 months ago
1998
Based on the notion of event-based behavioral abstraction EBBA we specify properties of object-oriented distributed systems in linear time temporal logic. These properties are the...