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CISSE
2008
Springer
15 years 8 months ago
Testing Grammars For Top-Down Parsers
According to the software engineering perspective, grammars can be viewed as "Specifications for defining languages or compilers". They form the basics of languages and ...
A. M. Paracha, F. Franek
ICPPW
2009
IEEE
16 years 1 months ago
Evaluation of Existing Schedulability Tests for Global EDF
—The increasing attention on global scheduling algorithms for identical multiprocessor platforms produced different, independently developed, schedulability tests. However, the e...
Marko Bertogna
ETS
2006
IEEE
100views Hardware» more  ETS 2006»
16 years 23 days ago
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...
Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun,...
ATS
2003
IEEE
126views Hardware» more  ATS 2003»
16 years 16 hour ago
Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces
Abstract: As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates th...
Zaid Al-Ars, A. J. van de Goor
ICCD
2003
IEEE
113views Hardware» more  ICCD 2003»
16 years 8 hour ago
Multiple Transition Model and Enhanced Boundary Scan Architecture to Test Interconnects for Signal Integrity
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nour...