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166
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
186
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ICSE
2005
IEEE-ACM
16 years 6 months ago
2005
IEEE-ACM
We present an automatic error-detection approach that combines static checking and concrete test-case generation. Our approach consists of taking the abstract error conditions inf...
165
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KBSE
2006
IEEE
16 years 22 days ago
2006
IEEE
The testing of database applications poses new challenges for software engineers. In particular, it is difficult to thoroughly test the interactions between an application and it...
153
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FATES
2003
Springer
15 years 12 months ago
2003
Springer
Most efforts to combine formal methods and software testing go in the direction of exploiting formal methods to solve testing problems, most commonly test case generation. Here we ...
181
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VTS
2002
IEEE
15 years 11 months ago
2002
IEEE
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is diffic...