5855 search results - page 289 / 1171 » Test generation and minimization with |
152
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ISCAS
2006
IEEE
16 years 21 days ago
2006
IEEE
— The paper presents a simple stochastic model of a True Random Number Generator, which extracts randomness from the tracking jitter of a phase-locked loop. The existence of such...
187
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ICOIN
2004
Springer
16 years 2 days ago
2004
Springer
Abstract. In this paper we present the set of base algorithms for generating connected random graphs (RG). RG can be used for testing different algorithms on networks. The fast al...
293
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POPL
2009
ACM
16 years 7 months ago
2009
ACM
We study modular, automatic code generation from hierarchical block diagrams with synchronous semantics. Such diagrams are the fundamental model behind widespread tools in the emb...
173
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ITC
2000
IEEE
15 years 10 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
200
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ML
2002
ACM
15 years 6 months ago
2002
ACM
We examine linear program (LP) approaches to boosting and demonstrate their efficient solution using LPBoost, a column generation based simplex method. We formulate the problem as...