5855 search results - page 264 / 1171 » Test generation and minimization with |
194
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QSIC
2005
IEEE
16 years 7 days ago
2005
IEEE
This paper proposes a stochastic voting for testing a large number of Web Services (WS) under group testing. In the future, a large number of WS will be available and they need to...
166
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COMPSAC
2003
IEEE
15 years 12 months ago
2003
IEEE
Usual techniques for automatic test data generation are based on the assumption that a complete oracle will be available during the testing process. However, there are programs fo...
157
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ATS
1998
IEEE
15 years 11 months ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
160
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EMSOFT
2006
Springer
15 years 10 months ago
2006
Springer
A key problem for effective unit testing is the difficulty of partitioning large software systems into appropriate units that can be tested in isolation. We present an approach th...
202
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DFT
2006
IEEE
15 years 8 months ago
2006
IEEE
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...