5855 search results - page 263 / 1171 » Test generation and minimization with |
171
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ISCIS
2004
Springer
16 years 22 hour ago
2004
Springer
Testing is a necessary, but costly process for user-centric quality control. Moreover, testing is not comprehensive enough to completely detect faults. Many formal methods have bee...
189
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DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. We show that such ...
148
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ESE
2006
15 years 6 months ago
2006
This research addresses the problem of statically analyzing input command syntax as defined in interface and requirements specifications and then generating test cases for dynamic ...
197
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ASPDAC
2009
ACM
16 years 1 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
178
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APSEC
2006
IEEE
16 years 22 days ago
2006
IEEE
Testing for time-related behaviors of PLC software is important and should be performed carefully. We propose a structural testing technique on Function Block Diagram(FBD) network...