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DATE
2004
IEEE
15 years 10 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
159
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...
206
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PTS
2003
15 years 8 months ago
2003
UML models focus primarily on the definition of system structure and behaviour, but provide only limited means for describing test objectives and test procedures. However, with the...
213
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GECCO
2008
Springer
15 years 7 months ago
2008
Springer
Evolutionary testing denotes the use of evolutionary algorithms, e.g., Genetic Algorithms (GAs), to support various test automation tasks. Since evolutionary algorithms are heuris...
158
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CEC
2010
IEEE
15 years 3 months ago
2010
IEEE
TestFul is a novel evolutionary testing approach for object-oriented programs with complex internal states. In our preliminary experiments, it already outperformed some of the well...