5855 search results - page 259 / 1171 » Test generation and minimization with |
169
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KBSE
2005
IEEE
16 years 7 days ago
2005
IEEE
Test factoring creates fast, focused unit tests from slow system-wide tests; each new unit test exercises only a subset of the functionality exercised by the system test. Augmenti...
163
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COCO
2005
Springer
16 years 6 days ago
2005
Springer
We continue the study of noncommutative polynomial identity testing initiated by Raz and Shpilka and present efficient algorithms for the following problems in the noncommutative...
148
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DFT
1999
IEEE
15 years 11 months ago
1999
IEEE
Fault identification capabilities are becoming increasingly important in modern designs, not only in support of design debugging methodologies, but also for the purpose of process...
125
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TVLSI
1998
15 years 6 months ago
1998
Abstract—Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we ...
161
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AICT
2006
IEEE
16 years 22 days ago
2006
IEEE
Computer aided tests replace traditional written answers on paper sheets with electronic records. For subjective tests, computers are not able to do all grading jobs, due to limit...