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VTS
1996
IEEE
112views Hardware» more  VTS 1996»
15 years 10 months ago
Optimal voltage testing for physically-based faults
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
Yuyun Liao, D. M. H. Walker
ICCAD
1995
IEEE
180views Hardware» more  ICCAD 1995»
15 years 10 months ago
Design based analog testing by Characteristic Observation Inference
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is...
Walter M. Lindermeir, Helmut E. Graeb, Kurt Antrei...
CSEE
2006
Springer
15 years 8 months ago
On the Influence of Test-Driven Development on Software Design
Test-driven development (TDD) is an agile software development strategy that addresses both design and testing. This paper describes a controlled experiment that examines the effe...
David Janzen, Hossein Saiedian
ETS
2007
IEEE
128views Hardware» more  ETS 2007»
15 years 8 months ago
Selecting Power-Optimal SBST Routines for On-Line Processor Testing
Software-Based Self-Test (SBST) has emerged as an effective strategy for on-line testing of processors integrated in non-safety critical embedded system applications. Among the mo...
Andreas Merentitis, Nektarios Kranitis, Antonis M....
FORTE
2008
15 years 8 months ago
Detecting Communication Protocol Security Flaws by Formal Fuzz Testing and Machine Learning
Network-based fuzz testing has become an effective mechanism to ensure the security and reliability of communication protocol systems. However, fuzz testing is still conducted in a...
Guoqiang Shu, Yating Hsu, David Lee