In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is...
Walter M. Lindermeir, Helmut E. Graeb, Kurt Antrei...
Test-driven development (TDD) is an agile software development strategy that addresses both design and testing. This paper describes a controlled experiment that examines the effe...
Software-Based Self-Test (SBST) has emerged as an effective strategy for on-line testing of processors integrated in non-safety critical embedded system applications. Among the mo...
Andreas Merentitis, Nektarios Kranitis, Antonis M....
Network-based fuzz testing has become an effective mechanism to ensure the security and reliability of communication protocol systems. However, fuzz testing is still conducted in a...