5855 search results - page 256 / 1171 » Test generation and minimization with |
270
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ICST
2011
IEEE
14 years 10 months ago
2011
IEEE
—The length of test cases is a little investigated topic in search-based test generation for object oriented software, where test cases are sequences of method calls. While intui...
137
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DATE
2005
IEEE
16 years 8 days ago
2005
IEEE
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prio...
178
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ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
Store-and-generate techniques encode a given test set and regenerate the original test set during the test with the help of a decoder. Previous research has shown that runlength c...
166
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DAC
2008
ACM
16 years 7 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
158
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CORR
2010
Springer
15 years 6 months ago
2010
Springer
Non-adaptive group testing involves grouping arbitrary subsets of n items into different pools. Each pool is then tested and defective items are identified. A fundamental question...