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156
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AMOST
2005
ACM
16 years 5 days ago
2005
ACM
We consider the problem of generating a set of test cases from a black box specification. We focus on stress testing, i.e. picking test cases that seem most likely to reveal prog...
156
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TAP
2008
Springer
15 years 6 months ago
2008
Springer
This article presents the generation and test case execution under the framework Focal. In the programming language Focal, all properties of the program are written within the sour...
160
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
157
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ITNG
2008
IEEE
16 years 1 months ago
2008
IEEE
A method of using Markov chain techniques for combinatorial test case selection is presented. The method can be used for statistical and coverage testing of many software programs...
148
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ICCAD
1998
IEEE
15 years 11 months ago
1998
IEEE
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...