5855 search results - page 222 / 1171 » Test generation and minimization with |
149
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ITC
1998
IEEE
15 years 10 months ago
1998
IEEE
Existing high-level BIST synthesis methods focus on one objective, minimizing either area overhead or test time. Hence, those methods do not render exploration of large design spa...
185
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DAC
1996
ACM
15 years 10 months ago
1996
ACM
We propose a low-overhead scan design methodology which employs a new test point insertion technique to establish scan paths through the functional logic. The technique re-uses th...
189
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ET
2006
15 years 6 months ago
2006
In this paper, an optimization methodology is used to select the locations and characteristics of test, diagnosis and rework operations in electronic systems assembly processes. Re...
166
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ACSAC
2003
IEEE
15 years 12 months ago
2003
IEEE
This paper reports an experiment aimed at generating synthetic test data for fraud detection in an IP based videoon-demand service. The data generation verifies a methodology pre...
208
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TSP
2010
15 years 1 months ago
2010
Sparse graphical models have proven to be a flexible class of multivariate probability models for approximating high-dimensional distributions. In this paper, we propose techniques...