5855 search results - page 220 / 1171 » Test generation and minimization with |
192
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GI
2007
Springer
16 years 23 days ago
2007
Springer
: In this article we advocate an integrated approach for the automation of module or software integration testing and static analysis. It is illustrated how funmethods of static an...
153
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ISVC
2007
Springer
16 years 22 days ago
2007
Springer
This paper presents a technique that allows test engineers to visually analyze and explore within memory chip test data. We represent the test results from a generation of chips al...
146
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DATE
2005
IEEE
16 years 6 days ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
159
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HICSS
2003
IEEE
15 years 12 months ago
2003
IEEE
Statistical testing of software based on a usage model is a cost-effective and efficient means to make inferences about software quality. In order to apply this method, a usage m...
160
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VTS
1997
IEEE
15 years 10 months ago
1997
IEEE
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...