5855 search results - page 219 / 1171 » Test generation and minimization with |
155
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COCO
2006
Springer
15 years 8 months ago
2006
Springer
We study the identity testing problem for depth 3 arithmetic circuits ( circuit). We give the first deterministic polynomial time identity test for circuits with bounded top fanin...
141
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ICCAD
2009
IEEE
15 years 4 months ago
2009
IEEE
A generalized Hamiltonian method (GHM) is proposed for passivity test of descriptor systems (DSs) which describe impedance or admittance input-output responses. GHM can test passi...
176
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ICES
2000
Springer
15 years 10 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
194
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TSE
2010
15 years 5 months ago
2010
Search based optimization techniques have been applied to structural software test data generation since 1992, with a recent upsurge in interest and activity within this area. How...
162
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DDECS
2008
IEEE
16 years 1 months ago
2008
IEEE
— Testing SoC is a challenging task, especially when addressing complex and highfrequency devices. Among the different techniques that can be exploited, Software-Based Selft-Test...