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182
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DFT
2002
IEEE
15 years 11 months ago
2002
IEEE
Many digital circuits have constraints on the logic values a set of signal lines can have. In this paper, we present two new techniques for detecting the illegal combinations of l...
132
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ATS
1997
IEEE
15 years 10 months ago
1997
IEEE
This paper considers two types of n-bit adders, ripple carry adders and cascaded carry look-ahead adders, with minimum tests for stuck-at fault models. In the first part, we prese...
176
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BIOSIG
2003
15 years 8 months ago
2003
Abstract: Biometric identification and verification technologies, in the past, have promised high performance levels. Such performance statements lead to the assumption, that these...
134
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TIT
1998
15 years 6 months ago
1998
—Page’s test is optimal for detecting a permanent change in distribution, in the sense that it minimizes the worst case average delay to detection given an average distance bet...
127
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ICCAD
2009
IEEE
15 years 4 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...