5855 search results - page 216 / 1171 » Test generation and minimization with |
187
click to vote
ICST
2010
IEEE
15 years 5 months ago
2010
IEEE
—In this case study we test a landing gear control system of a military aircraft with the new version of LUTESS, a tool for testing automatically synchronous software. LUTESS req...
191
click to vote
PTS
2000
15 years 8 months ago
2000
Systems constructed from components, including distributed systems, consist of a number of elements that interact with each other. As the number of network elements or interchangea...
172
click to vote
ET
2002
15 years 6 months ago
2002
In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...
186
click to vote
TSE
2010
15 years 5 months ago
2010
We present an algorithm Dash to check if a program P satisfies a safety property ϕ. The unique feature of the algorithm is that it uses only test generation operations, and nes ...
155
click to vote
ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
This work discusses the impact of power consumption on the test time of core-based systems, when an available on-chip network is reused as test access mechanism. A previously prop...