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196
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SIGMOD
2010
ACM
15 years 10 months ago
2010
ACM
A database application differs form regular applications in that some of its inputs may be database queries. The program will execute the queries on a database and may use any re...
185
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CASES
2007
ACM
15 years 10 months ago
2007
ACM
Embedded systems are often used in safety-critical environments. Thus, thorough testing of them is mandatory. A quite active research area is the automatic test-case generation fo...
154
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DATE
2006
IEEE
16 years 19 days ago
2006
IEEE
This paper presents a wrapper and test access mechanism design for multi-clock domain SoCs that consists of cores with different clock frequencies during test. We also propose a t...
171
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ETS
2006
IEEE
16 years 19 days ago
2006
IEEE
In this paper we address the test scheduling problem for Builtin Self-tested (BISTed) embedded SRAMs (e-SRAMs) when Data Retention Faults (DRFs) are considered. The proposed test ...
210
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DFT
2002
IEEE
15 years 11 months ago
2002
IEEE
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...