5855 search results - page 210 / 1171 » Test generation and minimization with |
144
click to vote
VTS
1999
IEEE
15 years 11 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
138
click to vote
ATS
2009
IEEE
16 years 1 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
170
click to vote
ASYNC
2006
IEEE
16 years 19 days ago
2006
IEEE
We propose a low-overhead method for delay fault testing in high-speed asynchronous pipelines. The key features of our work are: (i) testing strategies can be administered using l...
158
click to vote
TACAS
2005
Springer
16 years 1 days ago
2005
Springer
This paper addresses the problem of generating symbolic test cases for testing the conformance of a black-box implementation with respect to a specification, in the context of rea...
202
click to vote
ACMSE
2006
ACM
16 years 17 days ago
2006
ACM
In this paper we consider the problem of automatically generating test suites associated with web-based enterprise systems. In particular, we discuss the construction of a tool de...