5855 search results - page 209 / 1171 » Test generation and minimization with |
167
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SIGSOFT
2009
ACM
16 years 1 months ago
2009
ACM
An objective of unit testing is to achieve high structural coverage of the code under test. Achieving high structural coverage of object-oriented code requires desirable method-ca...
230
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KDD
2007
ACM
16 years 21 days ago
2007
ACM
The support-confidence framework is the most common measure used in itemset mining algorithms, for its antimonotonicity that effectively simplifies the search lattice. This com...
172
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ERLANG
2008
ACM
15 years 8 months ago
2008
ACM
Current and future trends for software include increasingly complex requirements on interaction between systems. As a result, the difficulty of system testing increases. Model-bas...
154
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TCAD
2002
15 years 6 months ago
2002
Test scheduling is an important problem in system-on-a-chip (SOC) test automation. Efficient test schedules minimize the overall system test application time, avoid test resource c...
136
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DATE
2005
IEEE
16 years 6 days ago
2005
IEEE
We investigate a new fault ordering heuristic for test generation in full-scan circuits. The heuristic is referred to as the accidental detection index. It associates a value ADI ...