5855 search results - page 206 / 1171 » Test generation and minimization with |
134
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DATE
2005
IEEE
16 years 5 days ago
2005
IEEE
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...
179
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PTS
2010
15 years 5 months ago
2010
We present an application of learning-based testing to the problem of automated test case generation (ATCG) for numerical software. Our approach uses n-dimensional polynomial model...
151
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WCE
2007
15 years 7 months ago
2007
- We proposed the cost effective (in sense of gate number) asynchronous two-level logic. It is based on AND-OR implementation of minimized logic functions. We formulated and proved...
211
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SIGMOD
2011
ACM
14 years 9 months ago
2011
ACM
We study the problem of generating synthetic databases having declaratively specified characteristics. This problem is motivated by database system and application testing, data ...
169
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...