5855 search results - page 203 / 1171 » Test generation and minimization with |
159
click to vote
CLUSTER
2007
IEEE
16 years 24 days ago
2007
IEEE
— The thermal environment of data centers plays a significant role in affecting the energy efficiency and the reliability of data center operation. A dominant problem associate...
201
click to vote
ISSTA
2007
ACM
15 years 8 months ago
2007
ACM
Progress in testing requires that we evaluate the effectiveness of testing strategies on the basis of hard experimental evidence, not just intuition or a priori arguments. Random ...
189
click to vote
MOR
2010
15 years 5 months ago
2010
We study the convergence properties of an alternating proximal minimization algorithm for nonconvex structured functions of the type: L(x, y) = f(x)+Q(x, y)+g(y), where f : Rn → ...
165
click to vote
ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
185
click to vote
ATS
2001
IEEE
15 years 10 months ago
2001
IEEE
Testing embedded cores in a System-on-a-chip necessitates the use of a Test Access Mechanism, which provides for transportation of the test data between the chip and the core I/Os...