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160
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DSD
2005
IEEE
16 years 5 days ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
172
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ATS
2001
IEEE
15 years 10 months ago
2001
IEEE
Test access is a major problem for core-based systemon-chip (SOC) designs. Since cores in an SOC are not directly accessible via chip inputs and outputs, special access mechanisms...
152
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
Mixed-signal design and test tools are failing to keep apace with the increasing necessity for design exploration at the e arly stages.We outline a methodolo gy and toolset to ena...
169
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SAT
2010
Springer
15 years 10 months ago
2010
Springer
Robustness and correctness are essential criteria for SAT and QBF solvers. We develop automated testing and debugging techniques designed and optimized for SAT and QBF solver devel...
125
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DATE
2007
IEEE
16 years 27 days ago
2007
IEEE
This paper proposes an efficient test methodology to test switches in a Network-on-Chip (NoC) architecture. A switch in an NoC consists of a number of ports and a router. Using th...