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166
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ICCAD
2000
IEEE
15 years 11 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
192
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
164
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ISQED
2007
IEEE
16 years 24 days ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
198
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FPGA
2000
ACM
15 years 10 months ago
2000
ACM
A method for evaluating and constructing sparse crossbars which are both area efficient and highly routable is presented. The evaluation method uses a network flow algorithm to ac...
177
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CP
2007
Springer
15 years 10 months ago
2007
Springer
Abstract. Computing the minimal network (or minimal CSP) representation of a given set of constraints over the Point Algebra (PA) is a fundamental reasoning problem. In this paper ...