5855 search results - page 163 / 1171 » Test generation and minimization with |
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DAC
1994
ACM
15 years 10 months ago
1994
ACM
State minimization of incompletely specifiedmachinesis an important step of FSM synthesis. An exact algorithm consists of generation of prime compatibles and solution of a binate ...
175
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SAT
2010
Springer
15 years 10 months ago
2010
Springer
Some SAT-solvers are equipped with the ability to produce resolution proofs for problems which are unsatisfiable. Such proofs are used in a variety of contexts, including finding...
144
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AMC
2006
15 years 6 months ago
2006
The problem of distinguishing density-independent (DI) from density-dependent (DD) demographic time series is important for understanding the mechanisms that regulate populations ...
160
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QSIC
2009
IEEE
16 years 1 months ago
2009
IEEE
—A well-founded testing theory encourages the practical application of test case generation techniques. This aims at overcoming the ever increasing complexity of softwareenabled ...
171
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ICCAD
1996
IEEE
15 years 10 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...